Fahid K A

Results-driven ATE Test Engineer with hands-on experience in developing and debugging automated test programs for mixed-signal and sensor ICs using ETS88 and V93000 platforms. Skilled in test program optimization, yield improvement, and production correlation for IoT and automotive applications. Strong foundation in semiconductor device fundamentals, analog/digital circuits, and DFT concepts.

Engineer L1 at Anora Instrumentation Private Limited (2023-07 – Present)

• Developed, debugged, and maintained Automated Test Equipment (ATE) test programs for mixed-signal and magnetic sensor ICs, ensuring compliance with design and product specifications.
• Created and implemented test plans for new silicon validation, reliability evaluation, and production qualification.
• Performed parametric testing, functional testing, and trim testing across voltage, temperature, and process corners for high-reliability semiconductor applications.
• Designed and implemented test algorithms and automated test software, including multi-site testing, binary search algorithms, and functional pattern optimization, achieving 25% test time reduction compared to legacy ETS300.
• Designed and executed experiments, performed data analysis and statistical evaluation, and provided insights for performance optimization and yield improvement.
• Executed ATE platform conversion projects (ETS300 to ETS88, Fusion to V93K), ensuring test coverage consistency, data correlation, and measurement accuracy.
• Applied circuit theory, analog and digital electronics, and electronic design principles to support product development, debug, and test correlation.
• Collaborated with Design, Product Engineering, DFT, Reliability, and Manufacturing teams for failure analysis, root-cause analysis, and yield enhancement.
• Demonstrated continuous learning, technical documentation, and knowledge sharing within cross-functional engineering teams.

B.Tech in Electrical & Electronics Engineering (Honours) – Government Engineering College, Thrissur (2019 – 2023)