PhD Scholar
أرسل عرض عمل مباشرة لهذا المرشح
SIONA CARMEL MENEZES received her B.E. degree in Electronics and Communication Engineering in 2005 and an MTech degree in Digital Electronics and Advanced Communication (D.E.A.C.) Engineering from the Electronics and Communication Department, Manipal Institute of Technology, India in 2007 and joined as a Lecturer in the same department from 2007-2010. She then worked as a Lecturer in the Engineering Department of AMA International University, Bahrain from 2011-2013, where she also held the position of Programme Head Informatics Engineering. She is currently pursuing a PhD from the Electrical and Electronics Engineering Department, BITS Pilani Dubai Campus, U.A.E.
Her research interests include microelectronics, semiconductor devices, reliability issues in MOS devices and circuits, neuromorphic circuits, systems, and applications.
September 2011 - May 2013
AMA International University - Salmabad, Bahrain
Lecturer in Electronics and Communication Engineering Dept.
August 2007 - February 2010
Manipal Institute of Technology - Manipal, India
Ph.D., Electrical and Electronics Dept., BITS Pilani Dubai Campus. U.A.E.
Expected in 02.2023
Thesis entitled “Design of Aging-Aware Circuit for Device Reliability Issues” has been submitted. It is currently under review
Published Research Articles during the course of the Ph.D.
1. S. M. Picardo, J. B. Shaik, S. Singhal, and N. Goel, “Enabling Efficient Rate and Temporal Coding using Reliability-Aware Design of a Neuromorphic Circuit,” International Journal of Circuit Theory and Applications, pp. 1-17, 2022.
2. S. M. Picardo, J. B. Shaik, S. Singhal, and N. Goel, "Device Reliability Affecting Coding Schemes in Neuromorphic Circuits," 2022 IEEE Region 10 Symposium (TENSYMP), 2022, pp. 1-6, .
3. Jani Babu Shaik, Sonal Singhal, Siona Menezes Picardo, and Nilesh Goel, “Impact of various NBTI distributions on SRAM performance for FinFET technology,” Integration, vol. 83, pp. 60-66, 2022.
4. S. M. Picardo, J. B. Shaik, N. Goel, and S. Singhal, “Integral impact of PVT variation with NBTI degradation on the dynamic and static SRAM performance metric,” International Journal of Electronics, vol. 109, no. 2, pp. 293-316, 2021.
5. S. M. Picardo, J. B. Shaik, S. Sahni, N. Goel, S. Singhal, “Analyzing the Impact of NBTI and Process Variability on Dynamic SRAM Metrics Under Temperature Variations,” In Goel, N., Hasan, S., Kalaichelvi, V. (eds) Modelling, Simulation, and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer, Singapore, 2020, pp. 608-616.
6. J. B. Shaik, S. M. Picardo, S. Singhal, and N. Goel, "Impact of Reliability Issues and Process Variability in Neuromorphic Circuits," 2022 IEEE Region 10 Symposium (TENSYMP), 2022, pp. 1-6.
7. Shaik Jani Babu, Anish Vipperla, Haarica Vinayaga Murthy, Chintakindi Sandhya, Siona Menezes Picardo, Sonal Singhal, and Nilesh Goel, “Investigating the impact of BTI and HCI on log-domain based Mihalas-Niebur Neuron circuit,” In Goel, N., Hasan, S., Kalaichelvi, V. (eds) Modelling, Simulation, and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol. 659. Springer, Singapore.
8. S. J. Babu, S. M. Picardo, S. Singhal, and N. Goel, “Reliability-Aware Design of Spike-Event Neuromorphic Circuits,” (under review).
MTech. in Digital Electronics and Advanced Communication Engineering, Manipal Institute of Technology - Manipal, India
.May 2007
Bachelor of Engineering in Electronics and Communication, Manipal Institute of Technology - Manipal, India
Foundation Degree in Science, Mount Carmel College - Bangalore, India.