Christian Maleriado

Test Development Engineer experienced in releasing quality driven WS and FT solutions. Has keen attention to details for quick resolution of issues, strives to implement cost effective methods and test optimization to maximize profitability.

Collaborative team player with excellent communication and interpersonal talents.

• Lead TDE for full NPI Development (from Test Planning, HW Design, Test

Software Programming, Debug, Correlation, Characterization,

Qualification, and Release) for both Wafer Sort and Final Test with robust test solutions.

• Handled multiple Automotive Supervisory, Monitoring, Reference,

and Linear Regulator products.

• Worked across different Tester Platforms such as ETS88, Teradyne

Microflex, TMT, LTX, and LCT/CTS; and Handlers like SRM, Rasco2000,

and prober TEL P8XL.

• Provided multiple Manufacturing Support like Test Time Reduction,

Low Yield Analysis and Improvement, Hardware Correlation Review,

Safelaunch, Customer Return Fix or Test Screen, Prototype

Generation, etc.

• Performed various Post NPI Introduction Releases such as Manufacturing

Transfer, Variant Releases, and Handler Migration.

• Published technical documents on issues encountered, root cause identification, and resolution; and uFLex routines for faster debugging.
• Trained an Intern who released a HW Checker solution. Mentor junior colleagues and new hires about test development fundamentals and processes.

Graduate of Bachelor of Science in Electronics and Communications Engineering